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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/Ben-HamidaAK96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bechir_Ayari>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Naim_Ben-Hamida>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.1996.563546>
foaf:homepage <https://doi.org/10.1109/ICCD.1996.563546>
dc:identifier DBLP conf/iccd/Ben-HamidaAK96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.1996.563546 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Testing of embedded A/D converters in mixed-signal circuit. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bechir_Ayari>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Naim_Ben-Hamida>
swrc:pages 135-136 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/Ben-HamidaAK96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/Ben-HamidaAK96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd1996.html#Ben-HamidaAK96>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.1996.563546>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:subject analogue-digital conversion; embedded A/D converters testing; mixed-signal circuit; functional testing; integral nonlinearity error; differential nonlinearity error; offset error; gain error; signal-to-noise ratio; digital circuit; FFT; histogram; transfer function; boolean function manipulation (xsd:string)
dc:title Testing of embedded A/D converters in mixed-signal circuit. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document