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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/ChaG08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jae_Chul_Cha>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.2008.4751865>
foaf:homepage <https://doi.org/10.1109/ICCD.2008.4751865>
dc:identifier DBLP conf/iccd/ChaG08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.2008.4751865 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Characterization of granularity and redundancy for SRAMs for optimal yield-per-area. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jae_Chul_Cha>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
swrc:pages 219-226 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/ChaG08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/ChaG08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd2008.html#ChaG08>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.2008.4751865>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:title Characterization of granularity and redundancy for SRAMs for optimal yield-per-area. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document