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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/FelthamNCM88>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Derek_Feltham>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/L._Richard_Carley>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Phil_Nigh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.1988.25742>
foaf:homepage <https://doi.org/10.1109/ICCD.1988.25742>
dc:identifier DBLP conf/iccd/FelthamNCM88 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.1988.25742 (xsd:string)
dcterms:issued 1988 (xsd:gYear)
rdfs:label Current sensing for built-in testing of CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Derek_Feltham>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/L._Richard_Carley>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Phil_Nigh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly>
swrc:pages 454-457 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/1988>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/FelthamNCM88/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/FelthamNCM88>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd1988.html#FelthamNCM88>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.1988.25742>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:title Current sensing for built-in testing of CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document