Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/iccd/GrodsteinBBD03
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Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor.
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Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor.
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