Optimal single probe traversal algorithm for testing of MCM substrat.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/iccd/PendurkarCT96
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Optimal single probe traversal algorithm for testing of MCM substrat.
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multichip modules; optimal single probe traversal algorithm; MCM substrate testing; single probe; MCM interconnects; total distance; terminal pad; interconnection net; tour construction; arbitrary insertion; traveling salesman problem; shuffling techniques; total traversal cost; probe traversal time; multichip modules; electronics industry; semiconductor chips
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Optimal single probe traversal algorithm for testing of MCM substrat.
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