A Partitioning and Storage Based Built-in Test Pattern Generation Method for Synchronous Sequential Circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/iccd/PomeranzR01a
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/iccd/PomeranzR01a
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FICCD.2001.955017
>
foaf:
homepage
<
https://doi.org/10.1109/ICCD.2001.955017
>
dc:
identifier
DBLP conf/iccd/PomeranzR01a
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FICCD.2001.955017
(xsd:string)
dcterms:
issued
2001
(xsd:gYear)
rdfs:
label
A Partitioning and Storage Based Built-in Test Pattern Generation Method for Synchronous Sequential Circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy
>
swrc:
pages
148-153
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/iccd/2001
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/iccd/PomeranzR01a/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/iccd/PomeranzR01a
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/iccd/iccd2001.html#PomeranzR01a
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ICCD.2001.955017
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/iccd
>
dc:
title
A Partitioning and Storage Based Built-in Test Pattern Generation Method for Synchronous Sequential Circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document