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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/PomeranzR99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.1999.808575>
foaf:homepage <https://doi.org/10.1109/ICCD.1999.808575>
dc:identifier DBLP conf/iccd/PomeranzR99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.1999.808575 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label Fault Simulation Based Test Generation for Combinational Circuits Using Dynamically Selected Sub-Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
swrc:pages 412-417 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/PomeranzR99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/PomeranzR99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd1999.html#PomeranzR99>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.1999.808575>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:subject bridging faults, circuit partitioning, fault simulation, stuck-at faults, test generation. (xsd:string)
dc:title Fault Simulation Based Test Generation for Combinational Circuits Using Dynamically Selected Sub-Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document