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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/RadtkeBA95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jens_Bargfrede>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefan_Radtke>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Walter_Anheier>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.1995.528944>
foaf:homepage <https://doi.org/10.1109/ICCD.1995.528944>
dc:identifier DBLP conf/iccd/RadtkeBA95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.1995.528944 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Distributed automatic test pattern generation with a parallel FAN algorithm. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jens_Bargfrede>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefan_Radtke>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Walter_Anheier>
swrc:pages 698-702 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/RadtkeBA95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/RadtkeBA95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd1995.html#RadtkeBA95>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.1995.528944>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:subject digital circuits; parallel algorithms; genetic algorithms; computational complexity; logic testing; distributed automatic test pattern generation; parallel FAN algorithm; digital circuits; NP hard problem; backtracking mechanism; sequential algorithms; heterogeneous cluster of workstations; test vector compaction; genetic algorithm (xsd:string)
dc:title Distributed automatic test pattern generation with a parallel FAN algorithm. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document