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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/RajskiT03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jerzy_Tyszer>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.2003.1240915>
foaf:homepage <https://doi.org/10.1109/ICCD.2003.1240915>
dc:identifier DBLP conf/iccd/RajskiT03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.2003.1240915 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Test Data Compression and Compaction for Embedded Test of Nanometer Technology Designs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jerzy_Tyszer>
swrc:pages 331- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/RajskiT03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/RajskiT03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd2003.html#RajskiT03>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.2003.1240915>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:title Test Data Compression and Compaction for Embedded Test of Nanometer Technology Designs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document