Design for Testability to Combat Delay Faults. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/iccd/Savir99>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FICCD.1999.808574>
foaf:homepage	<https://doi.org/10.1109/ICCD.1999.808574>
dc:identifier	DBLP conf/iccd/Savir99 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FICCD.1999.808574 (xsd:string)
dcterms:issued	1999 (xsd:gYear)
rdfs:label	Design for Testability to Combat Delay Faults. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir>
swrc:pages	407-411 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/iccd/1999>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/iccd/Savir99/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/iccd/Savir99>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/iccd/iccd1999.html#Savir99>
rdfs:seeAlso	<https://doi.org/10.1109/ICCD.1999.808574>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:subject	LSSD, SRL, BIST, LFSR, MISR, Delay Test (xsd:string)
dc:title	Design for Testability to Combat Delay Faults. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document