[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/SureshK13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vikram_B._Suresh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.2013.6657043>
foaf:homepage <https://doi.org/10.1109/ICCD.2013.6657043>
dc:identifier DBLP conf/iccd/SureshK13 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.2013.6657043 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label Managing test coverage uncertainty due to thermal noise in nano-CMOS: A case-study on an SRAM array. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vikram_B._Suresh>
swrc:pages 201-206 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/SureshK13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/SureshK13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd2013.html#SureshK13>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.2013.6657043>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:title Managing test coverage uncertainty due to thermal noise in nano-CMOS: A case-study on an SRAM array. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document