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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/WuTYL07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Yang_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sheldon_X.-D._Tan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shih-Lien_Lu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei_Wu_0024>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.2007.4601920>
foaf:homepage <https://doi.org/10.1109/ICCD.2007.4601920>
dc:identifier DBLP conf/iccd/WuTYL07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.2007.4601920 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Improving the reliability of on-chip data caches under process variations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Yang_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sheldon_X.-D._Tan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shih-Lien_Lu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei_Wu_0024>
swrc:pages 325-332 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/WuTYL07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/WuTYL07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd2007.html#WuTYL07>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.2007.4601920>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:title Improving the reliability of on-chip data caches under process variations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document