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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/YoonHCS98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Heebyung_Yoon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Junwei_Hou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Madhavan_Swaminathan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.1998.727116>
foaf:homepage <https://doi.org/10.1109/ICCD.1998.727116>
dc:identifier DBLP conf/iccd/YoonHCS98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.1998.727116 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Fault detection and automated fault diagnosis for embedded integrated electrical passives. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Heebyung_Yoon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Junwei_Hou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Madhavan_Swaminathan>
swrc:pages 588-593 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/YoonHCS98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/YoonHCS98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd1998.html#YoonHCS98>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.1998.727116>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:title Fault detection and automated fault diagnosis for embedded integrated electrical passives. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document