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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/YousifG95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abdel-Fattah_Yousif>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Gu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.1995.528823>
foaf:homepage <https://doi.org/10.1109/ICCD.1995.528823>
dc:identifier DBLP conf/iccd/YousifG95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.1995.528823 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Concurrent automatic test pattern generation algorithm for combinational circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abdel-Fattah_Yousif>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Gu>
swrc:pages 286-291 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/YousifG95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/YousifG95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd1995.html#YousifG95>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.1995.528823>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:subject combinational circuits; logic testing; automatic testing; computational complexity; concurrent automatic test pattern generation algorithm; combinational circuits; NP-hard; global computations techniques; concurrent search; ISCAS'85; ISCAS'89 benchmarks (xsd:string)
dc:title Concurrent automatic test pattern generation algorithm for combinational circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document