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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/ZakH92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeffrey_V._Hill>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_C._Zak_Jr.>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.1992.276309>
foaf:homepage <https://doi.org/10.1109/ICCD.1992.276309>
dc:identifier DBLP conf/iccd/ZakH92 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.1992.276309 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
rdfs:label An IEEE 1149.1 Compliant Testability Architecture with Internal Scan. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeffrey_V._Hill>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_C._Zak_Jr.>
swrc:pages 436-442 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/1992>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/ZakH92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/ZakH92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd1992.html#ZakH92>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.1992.276309>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:title An IEEE 1149.1 Compliant Testability Architecture with Internal Scan. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document