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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icce-tw/HuangLCLLHLCWLJ22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chien-Wei_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Cherng_Liao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Hsuan_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ching-Ho_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chun-Chih_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gong-Kai_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jian-Hsing_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kai-Chieh_Hsu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ke-Horng_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li-Fan_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shao-Chang_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yeh-Ning_Jou>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCE-Taiwan55306.2022.9869282>
foaf:homepage <https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869282>
dc:identifier DBLP conf/icce-tw/HuangLCLLHLCWLJ22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCE-Taiwan55306.2022.9869282 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Gate Voltages Impacting on Latch-up Measurements. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chien-Wei_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Cherng_Liao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Hsuan_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ching-Ho_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chun-Chih_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gong-Kai_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jian-Hsing_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kai-Chieh_Hsu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ke-Horng_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li-Fan_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shao-Chang_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yeh-Ning_Jou>
swrc:pages 75-76 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icce-tw/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icce-tw/HuangLCLLHLCWLJ22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icce-tw/HuangLCLLHLCWLJ22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icce-tw/icce-tw2022.html#HuangLCLLHLCWLJ22>
rdfs:seeAlso <https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869282>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icce-tw>
dc:title Gate Voltages Impacting on Latch-up Measurements. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document