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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccps/Hofer22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Florian_Hofer_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCPS54341.2022.00032>
foaf:homepage <https://doi.org/10.1109/ICCPS54341.2022.00032>
dc:identifier DBLP conf/iccps/Hofer22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCPS54341.2022.00032 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label IEC 61131-3 Software Testing - Automatic test generation for native applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Florian_Hofer_0001>
swrc:pages 282-283 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccps/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccps/Hofer22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccps/Hofer22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccps/iccps2022.html#Hofer22>
rdfs:seeAlso <https://doi.org/10.1109/ICCPS54341.2022.00032>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccps>
dc:title IEC 61131-3 Software Testing - Automatic test generation for native applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document