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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccsa/Kim04a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wu_Woan_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-540-24709-8%5F28>
foaf:homepage <https://doi.org/10.1007/978-3-540-24709-8_28>
dc:identifier DBLP conf/iccsa/Kim04a (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-540-24709-8%5F28 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Parallel Testing Method by Partitioning Circuit Based on the Exhaustive Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wu_Woan_Kim>
swrc:pages 262-271 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccsa/2004-2>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccsa/Kim04a>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccsa/iccsa2004-2.html#Kim04a>
rdfs:seeAlso <https://doi.org/10.1007/978-3-540-24709-8_28>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccsa>
dc:title Parallel Testing Method by Partitioning Circuit Based on the Exhaustive Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document