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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccv/DoiSHIFK95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideaki_Doi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koichi_Karasaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tadashi_Iida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasuhiko_Hara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasuhiro_Fujishita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoko_Suzuki>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCV.1995.466887>
foaf:homepage <https://doi.org/10.1109/ICCV.1995.466887>
dc:identifier DBLP conf/iccv/DoiSHIFK95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCV.1995.466887 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideaki_Doi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koichi_Karasaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tadashi_Iida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasuhiko_Hara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasuhiro_Fujishita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoko_Suzuki>
swrc:pages 575-582 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccv/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccv/DoiSHIFK95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccv/DoiSHIFK95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccv/iccv1995.html#DoiSHIFK95>
rdfs:seeAlso <https://doi.org/10.1109/ICCV.1995.466887>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccv>
dc:subject printed circuit testing; printed circuit layout; circuit analysis computing; X-ray applications; feature extraction; inspection; real-time systems; real time X-ray inspection; real-time X-ray inspection; 3D defect; 3-D defects; circuit board patterns; defect detection techniques; three dimensional defects; printed circuit board; X-ray images; fine PCB patterns; intensity variation; perspective transform; sphere surface; X-ray detector; defect detection algorithm; feature extraction; heavy shading; signal processing (xsd:string)
dc:title Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document