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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icecsys/BusscheWMG11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elie_Maricau>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Georges_G._E._Gielen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pieter_De_Wit>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Simon_Vanden_Bussche>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICECS.2011.6122239>
foaf:homepage <https://doi.org/10.1109/ICECS.2011.6122239>
dc:identifier DBLP conf/icecsys/BusscheWMG11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICECS.2011.6122239 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elie_Maricau>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Georges_G._E._Gielen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pieter_De_Wit>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Simon_Vanden_Bussche>
swrc:pages 161-164 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icecsys/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icecsys/BusscheWMG11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icecsys/BusscheWMG11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icecsys/icecsys2011.html#BusscheWMG11>
rdfs:seeAlso <https://doi.org/10.1109/ICECS.2011.6122239>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icecsys>
dc:title Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document