Transient measurements and mixed quenching, active resetting circuit for SPAD in 0.35ő≥m high-voltage CMOS for achieving 218 Mcps.
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Transient measurements and mixed quenching, active resetting circuit for SPAD in 0.35ő≥m high-voltage CMOS for achieving 218 Mcps.
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Transient measurements and mixed quenching, active resetting circuit for SPAD in 0.35ő≥m high-voltage CMOS for achieving 218 Mcps.
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