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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icicdt/LiWTSGBMWZCGC23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bing_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christophe_Maleville>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dawei_Gao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guillaume_Besnard>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Olivier_Weber>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qiao_Teng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ran_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rui_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiao_Gong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xinze_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ying_Sun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuxuan_Wu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICICDT59917.2023.10332402>
foaf:homepage <https://doi.org/10.1109/ICICDT59917.2023.10332402>
dc:identifier DBLP conf/icicdt/LiWTSGBMWZCGC23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICICDT59917.2023.10332402 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Investigation of Random Telegraph Noise in Advanced Silicon-On-Insulator N-FETs: The Impact of Back Bias, Strain, and Hot Carrier Stress. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bing_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christophe_Maleville>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dawei_Gao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guillaume_Besnard>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Olivier_Weber>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qiao_Teng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ran_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rui_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiao_Gong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xinze_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ying_Sun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuxuan_Wu>
swrc:pages 116-119 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icicdt/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icicdt/LiWTSGBMWZCGC23/dblp>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icicdt/icicdt2023.html#LiWTSGBMWZCGC23>
rdfs:seeAlso <https://doi.org/10.1109/ICICDT59917.2023.10332402>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icicdt>
dc:title Investigation of Random Telegraph Noise in Advanced Silicon-On-Insulator N-FETs: The Impact of Back Bias, Strain, and Hot Carrier Stress. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document