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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icicdt/SuzukiKM13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atsuhiro_Kinoshita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masamichi_Suzuki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuichiro_Mitani>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICICDT.2013.6563335>
foaf:homepage <https://doi.org/10.1109/ICICDT.2013.6563335>
dc:identifier DBLP conf/icicdt/SuzukiKM13 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICICDT.2013.6563335 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atsuhiro_Kinoshita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masamichi_Suzuki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuichiro_Mitani>
swrc:pages 195-198 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icicdt/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icicdt/SuzukiKM13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icicdt/SuzukiKM13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icicdt/icicdt2013.html#SuzukiKM13>
rdfs:seeAlso <https://doi.org/10.1109/ICICDT.2013.6563335>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icicdt>
dc:title Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document