SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by őĪ-Particle Irradiation.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/icicdt/YoshidaNSIFK23
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SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by őĪ-Particle Irradiation.
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SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by őĪ-Particle Irradiation.
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