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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icip/VrhelT95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/B._L._Trus>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_J._Vrhel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICIP.1995.537529>
foaf:homepage <https://doi.org/10.1109/ICIP.1995.537529>
dc:identifier DBLP conf/icip/VrhelT95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICIP.1995.537529 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Multi-channel restoration of electron micrographs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/B._L._Trus>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_J._Vrhel>
swrc:pages 516-519 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icip/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icip/VrhelT95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icip/VrhelT95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icip/icip1995-2.html#VrhelT95>
rdfs:seeAlso <https://doi.org/10.1109/ICIP.1995.537529>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icip>
dc:subject electron microscopy; image restoration; deconvolution; interference suppression; electron micrographs; projection based multichannel restoration method; input signal; noise reduction; simulation; degradation uncertainty; sensitivity; multichannel deconvolution (xsd:string)
dc:title Multi-channel restoration of electron micrographs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document