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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icitee/Ren23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yan_Ren>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3640115.3640134>
foaf:homepage <https://doi.org/10.1145/3640115.3640134>
dc:identifier DBLP conf/icitee/Ren23 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3640115.3640134 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label An In-depth Investigation on the Structure, Characteristics, and Potential Applications of GaN/SiC Mosfet-Based Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yan_Ren>
swrc:pages 115-118 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icitee/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icitee/Ren23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icitee/Ren23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icitee/icitee2023.html#Ren23>
rdfs:seeAlso <https://doi.org/10.1145/3640115.3640134>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icitee>
dc:title An In-depth Investigation on the Structure, Characteristics, and Potential Applications of GaN/SiC Mosfet-Based Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document