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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icmcs2/DherbecourtLJDM14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eric_Joubert>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hichame_Maanane>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean_Pierre_Sipma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karine_Dehais-Mourgues>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Olivier_Latry>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pascal_Dherb%E2%88%9A%C2%A9court>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Philippe_Eudeline>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICMCS.2014.6911246>
foaf:homepage <https://doi.org/10.1109/ICMCS.2014.6911246>
dc:identifier DBLP conf/icmcs2/DherbecourtLJDM14 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICMCS.2014.6911246 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
rdfs:label A workbench development for L-band LDMOS amplifier reliability study (electronic power transistors reliabilty for radar applications). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eric_Joubert>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hichame_Maanane>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean_Pierre_Sipma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karine_Dehais-Mourgues>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Olivier_Latry>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pascal_Dherb%E2%88%9A%C2%A9court>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Philippe_Eudeline>
swrc:pages 1573-1578 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icmcs2/2014>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icmcs2/DherbecourtLJDM14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icmcs2/DherbecourtLJDM14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icmcs2/icmcs2014.html#DherbecourtLJDM14>
rdfs:seeAlso <https://doi.org/10.1109/ICMCS.2014.6911246>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icmcs2>
dc:title A workbench development for L-band LDMOS amplifier reliability study (electronic power transistors reliabilty for radar applications). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document