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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icmens/FerrarisMS05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Biagio_De_Masi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eleonora_Ferraris>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Irene_Fassi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marco_Del_Sarto>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICMENS.2005.99>
foaf:homepage <https://doi.org/10.1109/ICMENS.2005.99>
dc:identifier DBLP conf/icmens/FerrarisMS05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICMENS.2005.99 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Polysilicon Fatigue Test-Bed Monitoring Based on the 2nd Harmonic of the Device Current Measurement. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Biagio_De_Masi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eleonora_Ferraris>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Irene_Fassi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marco_Del_Sarto>
swrc:pages 55-60 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icmens/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icmens/FerrarisMS05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icmens/FerrarisMS05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icmens/icmens2005.html#FerrarisMS05>
rdfs:seeAlso <https://doi.org/10.1109/ICMENS.2005.99>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icmens>
dc:subject Fatigue testing, 2nd harmonic of the device current, on-chip test design. (xsd:string)
dc:title Polysilicon Fatigue Test-Bed Monitoring Based on the 2nd Harmonic of the Device Current Measurement. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document