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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icmens/SadekM03a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Khaled_Sadek>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Walied_A._Moussa>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICMENS.2003.1222029>
foaf:homepage <https://doi.org/10.1109/ICMENS.2003.1222029>
dc:identifier DBLP conf/icmens/SadekM03a (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICMENS.2003.1222029 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Application of Adaptive Multilevel Substructuring Technique to Model CMOS Micromachined Thermistor Gas Sensor, Part (II): Effect of Manufacturing Uncertainties in the Reliability of MEMS. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Khaled_Sadek>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Walied_A._Moussa>
swrc:pages 390-395 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icmens/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icmens/SadekM03a/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icmens/SadekM03a>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icmens/icmens2003.html#SadekM03a>
rdfs:seeAlso <https://doi.org/10.1109/ICMENS.2003.1222029>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icmens>
dc:title Application of Adaptive Multilevel Substructuring Technique to Model CMOS Micromachined Thermistor Gas Sensor, Part (II): Effect of Manufacturing Uncertainties in the Reliability of MEMS. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document