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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icmssp/JaffriSAAY20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aftab_Ahmad>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jian_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liu_Shi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nasif_Raza_Jaffri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Usama_Abrar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3404716.3404722>
foaf:homepage <https://doi.org/10.1145/3404716.3404722>
dc:identifier DBLP conf/icmssp/JaffriSAAY20 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3404716.3404722 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Electrical Resistance Tomographic Image Enhancement Using MRNSD and LSQR. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aftab_Ahmad>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jian_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liu_Shi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nasif_Raza_Jaffri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Usama_Abrar>
swrc:pages 16-20 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icmssp/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icmssp/JaffriSAAY20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icmssp/JaffriSAAY20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icmssp/icmssp2020.html#JaffriSAAY20>
rdfs:seeAlso <https://doi.org/10.1145/3404716.3404722>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icmssp>
dc:title Electrical Resistance Tomographic Image Enhancement Using MRNSD and LSQR. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document