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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iconac/ChenLWLY18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haiyong_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jiali_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kun_Liu_0009>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peng_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuang_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FIConAC.2018.8748994>
foaf:homepage <https://doi.org/10.23919/IConAC.2018.8748994>
dc:identifier DBLP conf/iconac/ChenLWLY18 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FIConAC.2018.8748994 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Robust dislocation defects region segmentation for polysilicon wafer image. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haiyong_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jiali_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kun_Liu_0009>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peng_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuang_Wang>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iconac/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iconac/ChenLWLY18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iconac/ChenLWLY18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iconac/iconac2018.html#ChenLWLY18>
rdfs:seeAlso <https://doi.org/10.23919/IConAC.2018.8748994>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iconac>
dc:title Robust dislocation defects region segmentation for polysilicon wafer image. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document