[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icpads/LiLZKL23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aimin_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wenqiang_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaotong_Kong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuechen_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhiyao_Li>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICPADS60453.2023.00048>
foaf:homepage <https://doi.org/10.1109/ICPADS60453.2023.00048>
dc:identifier DBLP conf/icpads/LiLZKL23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICPADS60453.2023.00048 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label BEW-YOLO: An Improved Method for PCB Defect Detection Based on YOLOv7. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aimin_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wenqiang_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaotong_Kong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuechen_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhiyao_Li>
swrc:pages 268-274 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icpads/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icpads/LiLZKL23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icpads/LiLZKL23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icpads/icpads2023.html#LiLZKL23>
rdfs:seeAlso <https://doi.org/10.1109/ICPADS60453.2023.00048>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icpads>
dc:title BEW-YOLO: An Improved Method for PCB Defect Detection Based on YOLOv7. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document