[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icppw/SunG07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li_Guo_0004>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tianjia_Sun>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICPPW.2007.63>
foaf:homepage <https://doi.org/10.1109/ICPPW.2007.63>
dc:identifier DBLP conf/icppw/SunG07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICPPW.2007.63 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label One New In-Operation Self-Testability Mechanism Designed for SoC Microchips following IEEE STD 1500. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li_Guo_0004>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tianjia_Sun>
swrc:pages 35 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icppw/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icppw/SunG07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icppw/SunG07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icppw/icppw2007.html#SunG07>
rdfs:seeAlso <https://doi.org/10.1109/ICPPW.2007.63>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icppw>
dc:title One New In-Operation Self-Testability Mechanism Designed for SoC Microchips following IEEE STD 1500. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document