[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icpr/MuralikrishnanNR02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/B._Muralikrishnan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._Raja>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kayvan_Najarian>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICPR.2002.1044581>
foaf:homepage <https://doi.org/10.1109/ICPR.2002.1044581>
dc:identifier DBLP conf/icpr/MuralikrishnanNR02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICPR.2002.1044581 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/B._Muralikrishnan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Raja>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kayvan_Najarian>
swrc:pages 29-32 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icpr/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icpr/MuralikrishnanNR02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icpr/MuralikrishnanNR02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icpr/icpr2002-1.html#MuralikrishnanNR02>
rdfs:seeAlso <https://doi.org/10.1109/ICPR.2002.1044581>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icpr>
dc:title Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document