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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icsap/SharmaS10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aditi_Sood>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._K._Sharma>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICSAP.2010.61>
foaf:homepage <https://doi.org/10.1109/ICSAP.2010.61>
dc:identifier DBLP conf/icsap/SharmaS10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICSAP.2010.61 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aditi_Sood>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._K._Sharma>
swrc:pages 8-12 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icsap/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icsap/SharmaS10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icsap/SharmaS10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icsap/icsap2010.html#SharmaS10>
rdfs:seeAlso <https://doi.org/10.1109/ICSAP.2010.61>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icsap>
dc:subject Defect-Per Million (DPM), Built-In Self Test (BIST), Memory Built-in Self Test (MBIST), Microcoded MBIST, MUT (Memory Under Test) (xsd:string)
dc:title Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document