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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icse/BaudryFT06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Benoit_Baudry>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Franck_Fleurey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yves_Le_Traon>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1134285.1134299>
foaf:homepage <https://doi.org/10.1145/1134285.1134299>
dc:identifier DBLP conf/icse/BaudryFT06 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1134285.1134299 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Improving test suites for efficient fault localization. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Benoit_Baudry>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Franck_Fleurey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yves_Le_Traon>
swrc:pages 82-91 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icse/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icse/BaudryFT06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icse/BaudryFT06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icse/icse2006.html#BaudryFT06>
rdfs:seeAlso <https://doi.org/10.1145/1134285.1134299>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icse>
dc:subject diagnosis, mutation analysis, test generation (xsd:string)
dc:title Improving test suites for efficient fault localization. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document