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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icse/ImanishiKM23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuhiro_Kumon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuji_Morisaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoji_Imanishi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICSE-SEIP58684.2023.00044>
foaf:homepage <https://doi.org/10.1109/ICSE-SEIP58684.2023.00044>
dc:identifier DBLP conf/icse/ImanishiKM23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICSE-SEIP58684.2023.00044 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Identifying Defect Injection Risks from Analysis and Design Diagrams: An Industrial Case Study at Sony. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuhiro_Kumon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuji_Morisaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoji_Imanishi>
swrc:pages 420-431 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icse/2023seip>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icse/ImanishiKM23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icse/ImanishiKM23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icse/seip2023.html#ImanishiKM23>
rdfs:seeAlso <https://doi.org/10.1109/ICSE-SEIP58684.2023.00044>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icse>
dc:title Identifying Defect Injection Risks from Analysis and Design Diagrams: An Industrial Case Study at Sony. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document