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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icse/NagappanB05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nachiappan_Nagappan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_Ball>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1062455.1062514>
foaf:homepage <https://doi.org/10.1145/1062455.1062514>
dc:identifier DBLP conf/icse/NagappanB05 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1062455.1062514 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Use of relative code churn measures to predict system defect density. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nachiappan_Nagappan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_Ball>
swrc:pages 284-292 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icse/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icse/NagappanB05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icse/NagappanB05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icse/icse2005.html#NagappanB05>
rdfs:seeAlso <https://doi.org/10.1145/1062455.1062514>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icse>
dc:subject defect density, fault-proneness, multiple regression, principal component analysis, relative code churn (xsd:string)
dc:title Use of relative code churn measures to predict system defect density. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document