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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icsea/SumaN08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/T._R._Gopalakrishnan_Nair>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V._Suma_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICSEA.2008.79>
foaf:homepage <https://doi.org/10.1109/ICSEA.2008.79>
dc:identifier DBLP conf/icsea/SumaN08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICSEA.2008.79 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Enhanced Approaches in Defect Detection and Prevention Strategies in Small and Medium Scale Industries. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/T._R._Gopalakrishnan_Nair>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V._Suma_0001>
swrc:pages 389-393 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icsea/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icsea/SumaN08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icsea/SumaN08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icsea/icsea2008.html#SumaN08>
rdfs:seeAlso <https://doi.org/10.1109/ICSEA.2008.79>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icsea>
dc:subject Software Engineering, Software Process, Software Quality, Defect detection and Prevention, Inspections, Testing (xsd:string)
dc:title Enhanced Approaches in Defect Detection and Prevention Strategies in Small and Medium Scale Industries. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document