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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icsenst/Elangovan23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._Elangovan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICST59744.2023.10460805>
foaf:homepage <https://doi.org/10.1109/ICST59744.2023.10460805>
dc:identifier DBLP conf/icsenst/Elangovan23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICST59744.2023.10460805 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Self-Controlled Robust Digital Readout Circuit for Resistance Measurement: Enhancing Immunity to Circuit Nonidealities. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._Elangovan>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icsenst/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icsenst/Elangovan23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icsenst/Elangovan23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icsenst/icst2023.html#Elangovan23>
rdfs:seeAlso <https://doi.org/10.1109/ICST59744.2023.10460805>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icsenst>
dc:title Self-Controlled Robust Digital Readout Circuit for Resistance Measurement: Enhancing Immunity to Circuit Nonidealities. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document