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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icsenst/SelvamRH18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karthik_Selvam>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_J._Haji-Sheikh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Suma_Rajashankar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICSensT.2018.8603629>
foaf:homepage <https://doi.org/10.1109/ICSensT.2018.8603629>
dc:identifier DBLP conf/icsenst/SelvamRH18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICSensT.2018.8603629 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Measurement of Light Sensitivity of Chromium/Porous Silicon Schottky Diodes Made by Silicon Nitride Masking. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karthik_Selvam>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_J._Haji-Sheikh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Suma_Rajashankar>
swrc:pages 330-335 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icsenst/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icsenst/SelvamRH18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icsenst/SelvamRH18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icsenst/icst2018.html#SelvamRH18>
rdfs:seeAlso <https://doi.org/10.1109/ICSensT.2018.8603629>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icsenst>
dc:title Measurement of Light Sensitivity of Chromium/Porous Silicon Schottky Diodes Made by Silicon Nitride Masking. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document