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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icsim/NozakiY20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masaya_Yoshikawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yusuke_Nozaki>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3378936.3378980>
foaf:homepage <https://doi.org/10.1145/3378936.3378980>
dc:identifier DBLP conf/icsim/NozakiY20 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3378936.3378980 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Tamper Resistance Evaluation of TWINE Implemented on 8-bit Microcontroller. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masaya_Yoshikawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yusuke_Nozaki>
swrc:pages 226-231 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icsim/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icsim/NozakiY20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icsim/NozakiY20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icsim/icsim2020.html#NozakiY20>
rdfs:seeAlso <https://doi.org/10.1145/3378936.3378980>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icsim>
dc:title Tamper Resistance Evaluation of TWINE Implemented on 8-bit Microcontroller. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document