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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icsm/HaoZZMS05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dan_Hao_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hao_Zhong_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hong_Mei_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jiasu_Sun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lu_Zhang_0023>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICSM.2005.43>
foaf:homepage <https://doi.org/10.1109/ICSM.2005.43>
dc:identifier DBLP conf/icsm/HaoZZMS05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICSM.2005.43 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dan_Hao_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hao_Zhong_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hong_Mei_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jiasu_Sun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lu_Zhang_0023>
swrc:pages 683-686 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icsm/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icsm/HaoZZMS05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icsm/HaoZZMS05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icsm/icsm2005.html#HaoZZMS05>
rdfs:seeAlso <https://doi.org/10.1109/ICSM.2005.43>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icsm>
dc:title Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document