[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icst/KimJJO23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hakjoo_Oh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jinkook_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Minseok_Jeon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sejeong_Jang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICST57152.2023.00037>
foaf:homepage <https://doi.org/10.1109/ICST57152.2023.00037>
dc:identifier DBLP conf/icst/KimJJO23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICST57152.2023.00037 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Automating Endurance Test for Flash-based Storage Devices in Samsung Electronics. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hakjoo_Oh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jinkook_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Minseok_Jeon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sejeong_Jang>
swrc:pages 317-326 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icst/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icst/KimJJO23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icst/KimJJO23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icst/icst2023.html#KimJJO23>
rdfs:seeAlso <https://doi.org/10.1109/ICST57152.2023.00037>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icst>
dc:title Automating Endurance Test for Flash-based Storage Devices in Samsung Electronics. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document