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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ictes/PalamarchukK20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Olena_Kovalenko>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yevhen_Palamarchuk>
foaf:homepage <https://ceur-ws.org/Vol-2762/paper6.pdf>
dc:identifier DBLP conf/ictes/PalamarchukK20 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Optimization of Electronic Test Parameters in Learning Management Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Olena_Kovalenko>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yevhen_Palamarchuk>
swrc:pages 98-109 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ictes/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ictes/PalamarchukK20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ictes/PalamarchukK20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ictes/ictes2020.html#PalamarchukK20>
rdfs:seeAlso <https://ceur-ws.org/Vol-2762/paper6.pdf>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ictes>
dc:title Optimization of Electronic Test Parameters in Learning Management Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document