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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icwn/SampalliRTSRGAN10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Deepak_Tagra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jignasa_Shah>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Komalesh_Narayan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohammed_Al-Khatari>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Musfiq_Rahman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srinivas_Sampalli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vinod_Ramachandra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yash_Gugle>
dc:identifier DBLP conf/icwn/SampalliRTSRGAN10 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Test Suite for Vulnerability Analysis of RFID Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Deepak_Tagra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jignasa_Shah>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Komalesh_Narayan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohammed_Al-Khatari>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Musfiq_Rahman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srinivas_Sampalli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vinod_Ramachandra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yash_Gugle>
swrc:pages 70-75 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icwn/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icwn/SampalliRTSRGAN10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icwn/SampalliRTSRGAN10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icwn/icwn2010.html#SampalliRTSRGAN10>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icwn>
dc:title Test Suite for Vulnerability Analysis of RFID Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document