The effectiveness of delay and IDDT tests in detecting resistive open defects for nanometer CMOS adder circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/idt/HamiehMOCK11
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/idt/HamiehMOCK11
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ali_Chehab
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ayman_I._Kayssi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ghazalah_Omeirat
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Layla_Hamieh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nader_Mehdi
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIDT.2011.6123101
>
foaf:
homepage
<
https://doi.org/10.1109/IDT.2011.6123101
>
dc:
identifier
DBLP conf/idt/HamiehMOCK11
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIDT.2011.6123101
(xsd:string)
dcterms:
issued
2011
(xsd:gYear)
rdfs:
label
The effectiveness of delay and IDDT tests in detecting resistive open defects for nanometer CMOS adder circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ali_Chehab
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ayman_I._Kayssi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ghazalah_Omeirat
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Layla_Hamieh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nader_Mehdi
>
swrc:
pages
53-57
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/idt/2011
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/idt/HamiehMOCK11/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/idt/HamiehMOCK11
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/idt/idt2011.html#HamiehMOCK11
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IDT.2011.6123101
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/idt
>
dc:
title
The effectiveness of delay and IDDT tests in detecting resistive open defects for nanometer CMOS adder circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document