Binary Decision Tree Using K-means and Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ieaaie/KimPSKS04
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Binary Decision Tree Using K-means and Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip.
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Binary Decision Tree Using K-means and Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip.
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