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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iecon/DedaGOSKP16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guenter_Prochart>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Johannes_Ornig>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nikolay_Stefanov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Oliver_K%E2%88%9A%E2%88%82nig>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roland_Greul>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Selimcan_Deda>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIECON.2016.7793398>
foaf:homepage <https://doi.org/10.1109/IECON.2016.7793398>
dc:identifier DBLP conf/iecon/DedaGOSKP16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIECON.2016.7793398 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label Automated Hardware-in-the-loop testing for high voltage/power system "AVL E-STORAGE BTE". (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guenter_Prochart>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Johannes_Ornig>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nikolay_Stefanov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Oliver_K%E2%88%9A%E2%88%82nig>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roland_Greul>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Selimcan_Deda>
swrc:pages 6699-6704 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iecon/2016>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iecon/DedaGOSKP16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iecon/DedaGOSKP16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iecon/iecon2016.html#DedaGOSKP16>
rdfs:seeAlso <https://doi.org/10.1109/IECON.2016.7793398>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iecon>
dc:title Automated Hardware-in-the-loop testing for high voltage/power system "AVL E-STORAGE BTE". (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document