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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iecon/LachichiM21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amel_Lachichi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Phil_Mawby>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIECON48115.2021.9589563>
foaf:homepage <https://doi.org/10.1109/IECON48115.2021.9589563>
dc:identifier DBLP conf/iecon/LachichiM21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIECON48115.2021.9589563 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Bipolar Degradation monitoring of 4H-SiC MOSFET Power Devices by Electroluminescence Measurements. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amel_Lachichi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Phil_Mawby>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iecon/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iecon/LachichiM21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iecon/LachichiM21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iecon/iecon2021.html#LachichiM21>
rdfs:seeAlso <https://doi.org/10.1109/IECON48115.2021.9589563>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iecon>
dc:title Bipolar Degradation monitoring of 4H-SiC MOSFET Power Devices by Electroluminescence Measurements. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document